No.7（2012）7.Construction of Support System on Upstream Technology with X-ray Computed Tomography

Akira Monkawa, Tomoe Nakagawa, Yasuhito Kinjyo, Noboru Sakurai, Yoshiyasu Nagakawa, Kyoko Fujii, Yukio Yokoyama

  The X-ray computed tomography (XCT) systems have been developed for digital engineering that support processes such as internal dimension measurement, density analysis, actual and designed shape comparison, and reverse engineering. However, it is difficult to acquire a CT image of an industrial product because the XCT image includes some errors. The cause of these errors is beam hardening, ring artifacts, quantum noise and dependency on the condition of accelerating voltage and current. The problem can be reduced by using the best imaging conditions. In this study, we investigated the best conditions of the nano-focus, micro-focus, and high energy XCTs by noting the difference of accelerating voltage and current at the surface of the samples. Also, we changed conditions for the newly introduced nano-focus x-ray CT device and hard x-ray CT device.

Keywords
X-ray CT, Three-dimensional shape measurement, Digital engineering, STL, CAD, Database

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