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No.7（2012）2.Examination of a Higher Accuracy Method for Measuring the Dielectric Properties of Materials to 1 GHz
Kouichi Tokita, Hiroshi Shigematsu, Takeshi Kobayashi
Permittivity and dielectric loss tangents are important physical quantities for dielectric materials. Measuring those quantities and their frequency dependences is absolutely essential for product development. Recently, it is becoming increasingly important to measure them in not only kHz and MHz but also in the GHz frequency range.
We have established a method for measuring dielectric properties (i.e. permittivity and dielectric loss tangent) of dielectric materials to 1 GHz using general-purpose impedance measuring equipment. In general use, it is difficult to evaluate accurately dielectric properties for low loss dielectric materials using them. In order to improve the accuracy of the measurement, we try some technical methods. Then it was found that the accuracy of the permittivity and the loss tangent are improved by those methods.
Keywords
Permittivity, Loss tangent
