'%3e%3cpath%20id='パス_332'%20data-name='パス%20332'%20d='M4,5h8.375'%20transform='translate(-4%20-3.804)'%20fill='none'%20stroke='%23324eb3'%20stroke-linecap='round'%20stroke-linejoin='round'%20stroke-width='1.5'/%3e%3cpath%20id='パス_333'%20data-name='パス%20333'%20d='M7,4c0,5.8,0,8.375.6,9.571'%20transform='translate(-3.411%20-4)'%20fill='none'%20stroke='%23324eb3'%20stroke-linecap='round'%20stroke-linejoin='round'%20stroke-width='1.5'/%3e%3cpath%20id='パス_334'%20data-name='パス%20334'%20d='M11.178,8.6c0,2.735-2.393,5.384-4.187,5.384A2.855,2.855,0,0,1,4,11.589Q4,8,7.589,8c2.393,0,5.982.682,5.982,3.418a3.75,3.75,0,0,1-2.393,3.76'%20transform='translate(-4%20-3.214)'%20fill='none'%20stroke='%23324eb3'%20stroke-linecap='round'%20stroke-linejoin='round'%20stroke-width='1.5'/%3e%3cpath%20id='パス_335'%20data-name='パス%20335'%20d='M12,21.767,16.786,11l4.786,10.767'%20transform='translate(-2.429%20-2.625)'%20fill='none'%20stroke='%23324eb3'%20stroke-linecap='round'%20stroke-linejoin='round'%20stroke-width='1.5'/%3e%3cpath%20id='パス_336'%20data-name='パス%20336'%20d='M20.318,18H12.9'%20transform='translate(-2.252%20-1.251)'%20fill='none'%20stroke='%23324eb3'%20stroke-linecap='round'%20stroke-linejoin='round'%20stroke-width='1.5'/%3e%3c/g%3e%3c/svg%3e){kind=small}
English 
本部膜厚計（蛍光X線式）［プロセス技術G-2］
最終更新日2024年8月29日
用途
めっきの厚さ測定
仕様
X線照射領域径：Φ0.03mm
検出器：半導体
検出可能元素：Al から U まで
機器概要
- 分類
- G：形状計測・カメラ：寸法・形状計測
- 担当部署
- プロセス技術グループ
- 導入年度
- 2016
- 型番
- FT-150h
- 製造者
- 株式会社日立ハイテクサイエンス
- 対応試験規格
- JIS H8501-13 ／ ISO 3497
- 備考
機器利用は行っておりません。
料金表
設備利用'%3e%3cpath%20id='パス_322'%20data-name='パス%20322'%20d='M8,6.666A1.821,1.821,0,0,1,9.943,5H10.5a1.821,1.821,0,0,1,1.943,1.666,1.666,1.666,0,0,1-1.11,1.666,2.313,2.313,0,0,0-1.11,2.221'%20transform='translate(-8%20-5)'%20fill='none'%20stroke='%23324eb3'%20stroke-linecap='round'%20stroke-linejoin='round'%20stroke-width='1.5'/%3e%3cpath%20id='パス_323'%20data-name='パス%20323'%20d='M12,19v.006'%20transform='translate(-9.779%20-11.226)'%20fill='none'%20stroke='%23324eb3'%20stroke-linecap='round'%20stroke-linejoin='round'%20stroke-width='1.5'/%3e%3c/g%3e%3cg%20id='楕円形_100'%20data-name='楕円形%20100'%20transform='translate(2%202)'%20fill='none'%20stroke='%23324eb3'%20stroke-width='1.5'%3e%3ccircle%20cx='10'%20cy='10'%20r='10'%20stroke='none'/%3e%3ccircle%20cx='10'%20cy='10'%20r='9.25'%20fill='none'/%3e%3c/g%3e%3c/svg%3e){kind=small} | 試験項目 | 項目コード | 適用料金（税込） | |
|---|---|---|---|---|
| 中小 | 一般 | |||
| 依頼試験 | （2）表面処理皮膜試験 皮膜厚さ測定 蛍光エックス線式測定 [1箇所につき] | T412141 | 2,540円 | 4,420円 |
03-5530-2630
