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最終更新日2024年10月9日
用途
光源や物体の二次元分光放射輝度（画素ごとの放射輝度スペクトル）測定
仕様
波長範囲：380から1000nm
スペクトル分解能：5nm
解像度：1200×1024ピクセル（約123万画素）
共同研究、オーダーメード型技術支援などでのご利用が可能です。
まずは shoumei@iri-tokyo.jp までご連絡ください。
機器の紹介動画はこちら
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03-5530-2580
