No.7（2004）12.Degradation Efficiency of Chlorinated Phenols caused by Electron Attachment

印刷用ページを表示する　更新日：2016年12月19日更新

Seiko NAKAGAWA

The temperature dependence of the formation of negative ions was measured to investigate the degradation efficiency of chlorinated phenols caused by the electron attachment process. For all compounds, Cl^- was produced and the intensity of Cl^- increased with the increasing number of Cl atoms present in the molecule. For some chlorinated phenols, (M-HCl)^-, (M-H)^-, and M- (M=parent molecule) were also observed. The intensities of the fragment ions such as Cl^- and (M-HCl)^-, increased as the temperature increased, though that of the parent anion decreased. The result has shown that degradation of chlorinated phenols by electron attachment will occur efficiently at higher temperature.

Keywords
Chlorinated Phenol, Electron Attachment, Degradation, Negative Ion, Fragmentation

Back to Contents