No.4（2001）17.Development of simultaneous ion beam analysis with an ion accelerator

Masaru NAKAMURA and Hiroaki ISE

Elemental composition was determined by simultaneous ion beam analysis, particle induced X-ray emission (PIXE), particle induced gamma ray emission (PIGE) and Rutherford backscattering (RBS). PIXE provided data for elements from Al to U while the other techniques supplied information on elements lighter than Al like C, N, O, F and Na. The simultaneous analysis is fast, non-destructive and requires no sample preparation. It is very suitable for determination of elements in suspended particulate matter. The size distribution of carbon and trace elements in suspended particulate matter collected by a low pressure impactor has been investigated. Sampling was carried out in Setagaya, a typical residential area located southwest of Tokyo, Japan. The low pressure impactor has a cascade design with 12-stage collection plates, allowing the collection of size-fractionated suspended particulate matter. Also in this paper the size distribution and element concentrations in the suspended particulate matter are discussed.

Keywords
PIXE, PIGE, RBS, Ion beam analysis, Accelerator, Elemental analysis

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